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Scan Path Selectors With 8-Bit Bidirectional Data Buses Scan-Controlled IEEE Std (Rev. D)

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Scan Test Devices With 18-Bit Universal Bus Transceivers (Rev. E)

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Octal Bus Transceivers With 3-State Outputs (Rev. C)

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8-Bit To 9-Bit Parity Bus Transceivers (Rev. C)

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18-Bit Universal Bus Transceivers With 3-State Outputs (Rev. C)

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16-Bit Registered Transceivers With 3-State Outputs (Rev. C)

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18-Bit Universal Bus Transceivers With 3-State Outputs (Rev. B)

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Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops (Rev. E)

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Scan Test Devices With Octal D-Type Latches (Rev. F)

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Scan Test Devices With Octal Buffers (Rev. E)

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Scan Test Devices With Octal Bus Transceivers (Rev. E)

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Scan Test Devices With 18-Bit Inverting Bus Transceivers (Rev. C)

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Scan Test Devices With Octal Registered Bus Transceivers (Rev. D)

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Scan Test Devices With Octal Registered Bus Tranceivers (Rev. E)

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Scan Test Devices With 18-Bit Bus Transceivers And Registers (Rev. D)

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3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers (Rev. F)

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Scan Test Devices With 20-Bit Universal Bus Transceivers (Rev. C)

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Scan Test Devices With 18-Bit Transceivers And Registers (Rev. D)

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3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers

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3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers (Rev. F)

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